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2006-10-12
Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing - de Jack Ekin (Author)
Details Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing
Les données suivantes montre les informations complètes concernant Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing
Le Titre Du Fichier | Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties and Superconductor Critical-Current Testing |
Publié Le | 2006-10-12 |
Traducteur | Jaymz Keian |
Chiffre de Pages | 811 Pages |
La taille du fichier | 53.59 MB |
Langue | Français et Anglais |
Éditeur | ATOM Books |
ISBN-10 | 2915153838-GAX |
Format de Document | EPub AMZ PDF LRF WRI |
Écrivain | Jack Ekin |
EAN | 350-7385204119-OMH |
Nom de Fichier | Experimental-Techniques-for-Low-Temperature-Measurements-Cryostat-Design-Material-Properties-and-Superconductor-Critical-Current-Testing.pdf |
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Experimental Techniques for LowTemperature Measurements Cryostat Design Material Properties and Superconductor CriticalCurrent Testing Jack W Ekin
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